The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source
TenderZenith matches this tender's eligibility criteria against your company profile to calculate a deterministic qualification score and identify potential disqualifiers.
A structured breakdown of scope, eligibility requirements, submission steps, and key conditions — extracted directly from the official notice.
Sign in to unlock Bid Fit & AI Opportunity Intelligence
TenderZenith calculates a personalized qualification score against your company profile and extracts structured intelligence from tender documents with your 7-Day Pro Trial (No Credit Card Required).
Description & Project Overview
DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and elemental microanalysis by energy-dispersive X-ray spectroscopy (EDS) and ToF-SIMS. Procurement process: 01. Offentligt udbud