Supply of a nuclearized double electron and ion beam microscope (MEB-FIB) and its accessories (in-situ nano-indenter and metallization and carbon deposition system) for the Materials Physics Group. Lot 1 MEB/FIB
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Contract Description
Supply of a nuclearized double electron and ion beam microscope (MEB-FIB) and its accessories (in-situ nano-indenter and metallization and carbon deposition system) for the Materials Physics Group. Lot 1 MEB/FIB
Lot 1 - Supply of a “double beam” microscope, i.e. a scanning electron microscope (SEM) equipped with a focused ion beam column.
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