Supply of a nuclearized double electron and ion beam microscope (MEB-FIB) and its accessories (in-situ nano-indenter and metallization and carbon deposition system) for the Materials Physics Group. Lot 2 Nano-indenteur in situ
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Contract Description
Supply of a nuclearized double electron and ion beam microscope (MEB-FIB) and its accessories (in-situ nano-indenter and metallization and carbon deposition system) for the Materials Physics Group. Lot 2 Nano-indenteur in situ
Lot 2 - Supply of an in situ nano-indenter. Instrumented indentation platform that can be installed in a scanning electron microscope to carry out micro- and nano-mechanical tests in situ, in order to visualize the tests live with the microscope.
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