Uninstallation, relocation, reinstallation, commissioning DualBeam-FIB-SEM-Systems-Opex (PR1262394-3220-P)
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Description & Project Overview
Internal identifier: PR1262394-3220-P Title: Uninstallation, relocation, reinstallation, commissioning DualBeam-FIB-SEM-Systems-Opex Description: Uninstallation, relocation, reinstallation, commissioning DualBeam-FIB-SEM-Systems-Opex Type of order: Services Description: Deinstallation, relocation to a new location, reinstallation, reconnection (re-hook-up), commissioning, calibration and performance acceptance of an existing DualBeam FIB-SEM/FIB-REM system (Focused Ion Beam - Scanning Electron Microscope), manufacturer TESCAN GmbH, model GAIA3 GMH or GAIA3GMH, initial installation in 2018. Included are the existing system components, in particular Kleindiek micromanipulator, Oxford EDX detector and TOFWERK-TOF-SIMS. The scope of services also includes location and room measurements with regard to ground vibrations, acoustic influences and magnetic and electromagnetic interference fields. If necessary, suitable technical interference suppression and compensation measures must be planned and implemented. After reinstallation, the technical integrity and previous device performance must be verified through documented functional, vacuum, resolution, calibration and performance tests, including site acceptance tests.
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