Germany – Scanning probe microscopes – High-resolution atomic force microscope (AFM)
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Description & Project Overview
The subject of the procurement is a high-resolution atomic force microscope (AFM) including all hardware and software components required for operation. The system is used for the high-resolution characterization of surfaces and interfaces on the nano and atomic scale, especially for 3D AFM measurements in liquids as well as low-drift long-term measurements in research applications.