RF Probe Station (EMFT-06.3) - PR1004509-2270-P RF Probe Station (EMFT-06.3) - PR1004509-2270-P

RF Probe Station (EMFT-06.3) - PR1004509-2270-P RF Probe Station (EMFT-06.3) - PR1004509-2270-P
1 piece An automated sample station will be purchased for the measuring station described above in order to perform these measurements on chips, wafers, and sample holders for material testing. The sample station must be generally suitable for mmWave and sub-THz frequency probes. The most important requirements are that the sample station can carry at least four frequency extenders so that true differential device characterization is possible on a 2-port device without reconnecting. In addition, a microscope system suitable for mmWave and SubTHz measurements on chips and wafers is required, as well as a camera. The chuck of the wafer prober should allow forta rotation and movement in the z-direction. In addition, a thermal chuck system is required that ensures temperatures from -40 °C to 200 °C on the device under test. In general, the wafer prober should offer automatic control of the test process and control software with a user interface. The test station must generally be suitable for mmWave and SubTHz frequency probes.